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Daily HeadlinesJanuary 28, 2019

Bryan Huey’s lab used the tip of an Atomic Force Microscope (AFM) as a chisel to scrape away the surface of bismuth ferrite and map the electric landscape of the interior. (Image courtesy of the Huey Lab)

A Microscope as a Shovel? UConn Researchers Dig It

Using a familiar tool in a way it was never intended to be used opens up a whole new method to explore materials, report UConn researchers in a recent study. Read more.

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